JPH0248874U - - Google Patents
Info
- Publication number
- JPH0248874U JPH0248874U JP12871288U JP12871288U JPH0248874U JP H0248874 U JPH0248874 U JP H0248874U JP 12871288 U JP12871288 U JP 12871288U JP 12871288 U JP12871288 U JP 12871288U JP H0248874 U JPH0248874 U JP H0248874U
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- contact
- measurement contact
- semiconductor device
- exchanging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 11
- 239000004065 semiconductor Substances 0.000 claims description 2
- 230000004308 accommodation Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12871288U JPH0248874U (en]) | 1988-09-30 | 1988-09-30 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP12871288U JPH0248874U (en]) | 1988-09-30 | 1988-09-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0248874U true JPH0248874U (en]) | 1990-04-04 |
Family
ID=31382309
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP12871288U Pending JPH0248874U (en]) | 1988-09-30 | 1988-09-30 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0248874U (en]) |
-
1988
- 1988-09-30 JP JP12871288U patent/JPH0248874U/ja active Pending